Texture and microstructure analysis of epitaxial oxide layers prepared on textured Ni-12wt% Cr tapes

Journal of Physics D: Applied Physics

Volumn 36, Issue 9, 2003, Pages 1053-1057

  Huhne R ^a   Kursumovic, A ^a   Tomov, R I ^a   Glowacki, B A ^a   Holzapfel, B ^b   Evetts, J E ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b IFW DRESDEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM COMPOUNDS; CRYSTAL MICROSTRUCTURE; EPITAXIAL GROWTH; HIGH TEMPERATURE SUPERCONDUCTORS; INTERNAL OXIDATION; NICKEL; NICKEL COMPOUNDS; OXYGEN; POROUS MATERIALS; SUBSTRATES; SURFACE ROUGHNESS; TEXTURES;

EPITAXIAL OXIDE LAYER; FILM THICKNESS; MICROSTRUCTURE ANALYSIS; POROUS LAYER; TEXTURE ANALYSIS;

YTTRIUM BARIUM COPPER OXIDES;

EID: 0037799321     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/36/9/301     Document Type: Article

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