Angle-resolved x-ray imaging using a resolution-tunable double-crystal analyser

Journal of Physics D: Applied Physics

Volumn 36, Issue 13, 2003, Pages 1469-1472

  Hirano, K ^a  

^a INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; CRYSTALS; NUMERICAL METHODS; X RAYS;

ANGLE RESOLVED X-RAY IMAGING;

IMAGING TECHNIQUES;

EID: 0037767595     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/36/13/306     Document Type: Article

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