Efficient block designs for settings with spatially correlated errors

Biometrika

Volumn 84, Issue 2, 1997, Pages 443-454

  Uddin, Nizam ^a   Morgan, John P ^b  

^a TENNESSEE TECHNOLOGICAL UNIVERSITY   (United States)

^b OLD DOMINION UNIVERSITY   (United States)

Author keywords

Autononnal process; Correlated errors; Doubly geometric process; Efficiency; Generalised least squares; Neighbour design; Optimal design

Indexed keywords

EID: 0037764500     PISSN: 00063444     EISSN: None     Source Type: Journal    
DOI: 10.1093/biomet/84.2.443     Document Type: Article

References (18)

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