In-line phase-shifter calibration and drift measurement and compensation for digital speckle pattern interferometry (DSPI)

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2951, Issue , 1996, Pages 117-124

  De Veuster, Christophe ^a   Slangen, Pierre R ^b   Renotte, Yvon L M ^a   Berwart, Leon ^a   Lion, Yves F ^a  

^a UNIVERSITY OF LIÈGE   (Belgium)

^b ECOLE DES MINES D ALÈS   (France)

Author keywords

Calibration; Compensation; Drift; Phase shift; Speclde interferometry

Indexed keywords

CONTROL SYSTEM ANALYSIS; CONTROL THEORY; DATA PROCESSING; FEEDBACK; HOLOGRAPHIC INTERFEROMETRY; INTERFEROMETERS; INTERFEROMETRY; MODULATION; OPTICAL INSTRUMENTS; PHASE SHIFT; PIEZOELECTRIC ACTUATORS; PIEZOELECTRIC MATERIALS; PIEZOELECTRIC TRANSDUCERS; SEMICONDUCTING LEAD COMPOUNDS; SPECKLE; TRANSDUCERS;

ACCURATE CALIBRATIONS; ACTIVE CONTROLS; COMPENSATION; COMPENSATION METHODS; DIGITAL SPECKLE PATTERN INTERFEROMETRIES; DRIFT; DRIFT MEASUREMENTS; FEEDBACK LOOPS; IN LINES; INNOVATIVE METHODS; INTENSITY MODULATIONS; OSCILLATION PROBLEMS; PHASE DRIFTS; QUANTITATIVE MEASUREMENTS; REAL TIMES; SPECLDE INTERFEROMETRY;

CALIBRATION;

EID: 0037759834     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.262424     Document Type: Conference Paper

References (12)

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