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Volumn 57, Issue 23, 1990, Pages 2504-2506

Reaction patterning of YBa2Cu3O7-δ thin films on Si

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0037759382     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.104181     Document Type: Article
Times cited : (36)

References (11)
  • 10
    • 84950557153 scopus 로고    scopus 로고
    • We have not investigated YBCO films thicker than 400 Å due to the thickness limitation imposed by the thermally induced strain in the YBCO, which causes cracking to occur in films thicker than about 500 Å.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.