A laser probe coupled with ICP - Double-focusing sector-field mass spectrometer for in situ analysis of geological samples and U-Pb dating of zircon

Canadian Mineralogist

Volumn 41, Issue 2, 2003, Pages 259-272

  Tiepolo, Massimo ^a   Bottazzi, Piero ^a   Palenzona, Marco ^a   Vannucci, Riccardo ^b  

^a CNR   (Italy)

^b UNIVERSITY OF PAVIA   (Italy)

Author keywords

Accuracy; Double focusing sector field mass spectrometer; ICP MS; Laser ablation; Precision; Trace elements; U Pb; Zircon dating

Indexed keywords

FOCUSING; FRACTIONATION; INDUCTIVELY COUPLED PLASMA; LASER ABLATION; MASS SPECTROMETRY; SCANNING; ZIRCON;

LASER-INDUCED FRACTIONATION;

GEOLOGY;

INDUCTIVELY COUPLED PLASMA METHOD; MASS SPECTROMETRY; URANIUM-LEAD DATING; ZIRCON;

EID: 0037743669     PISSN: 00084476     EISSN: None     Source Type: Journal    
DOI: 10.2113/gscanmin.41.2.259     Document Type: Article

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