On the correlation between morphology and electronic properties of copper phthalocyanine (CuPc) thin films

Thin Solid Films

Volumn 436, Issue 1, 2003, Pages 70-75

  Grzadziel L ^a   Zak, J ^a   Szuber, J ^a  

^a SILESIAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Atomic force microscope; Copper phthalocyanine; Photoemission; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; COPPER COMPOUNDS; ELECTRONIC PROPERTIES; FERMI LEVEL; MORPHOLOGY; SURFACE ROUGHNESS; VACUUM DEPOSITED COATINGS;

BAND GAP;

THIN FILMS;

EID: 0037735086     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00511-X     Document Type: Conference Paper

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