Investigation of the crystal structure and electrical properties of La 3+-doped SrBi 2Ta 2O 9 ceramics

Journal of Materials Science: Materials in Electronics

Volumn 14, Issue 4, 2003, Pages 229-231

  Liu, Jingsong ^a   Zhang, Shuren ^a   Yang, Chengtao ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC DISPLACEMENTS; CONVENTIONAL MIXED OXIDE METHOD; CRYSTAL DEFORMATION; FERROELECTRIC HYSTERESIS LOOP MEASUREMENTS;

CRYSTAL STRUCTURE; DEGRADATION; DOPING (ADDITIVES); ELECTRIC PROPERTIES; FERROELECTRIC CERAMICS; FERROELECTRIC MATERIALS; LANTHANUM COMPOUNDS; MIXING; PEROVSKITE; SUBSTITUTION REACTIONS; X RAY DIFFRACTION ANALYSIS;

CERAMIC MATERIALS;

EID: 0037716963     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1022986030380     Document Type: Article

References (15)

1. C. A. P. De Araujo, J. D. Cuchlaro, L. D. McMillan and M. C. Scott, Nature (London) 374 (1995) 627.
2. O. Aucellio, J. F. Scott and R. Ramesh Phys. Today 51 (1998) 22.
3. C.-H. Lu and J.-T. Lee, Ceram. Int. 24 (1998) 285.
4. Z. Z. Huang, H. L. W. Chan, K. W. Kwok and C. L. Choy, J. Mater. Sci. 35 (2000) 1793.
5. D. Ravichandran, K. Yamakawa, A. S. Bhalla and R. Roy, J. Sol-gel Sci. Technol. 9 (1997) 95.
6. A. D. Rae, J. G. Thompson and R. L. Withers, Acta Crystallogr., Sect. B: Struct. Sci. 48 (1992) 418.
7. J.-K. Lee, B. Park and K.-S. Hong, J. Appl. Phys. 88 (2000) 2825.
8. M. Mahesh Kumar and Z.-G. Ye, ibid. 90 (2001) 934.
9. Y. Wu, M. J. Forbess, S. Seraji, S. J. Limmer and T. P. Chou, ibid. 89 (2001) 5647.
10. B. D. Cullity, "Elements of X-ray diffraction" (Addison-Wesley, Boston, MA, 1997) p. 383.
11. H. Irie, M. Miyayama and T. Kudo, J. Appl. Phys. 90 (2001) 4089.
12. Y. Shimakawa, Y. Kubo, Y. Nakagawa, T. Kamiyama, H. Asano and F. Izumi, Appl. Phys. Lett. 74 (1999) 1904.
13. A. Onodera, K. Yoshio, C. C. Myint, S. Kojima, H. Yamashita and T. Takama, Jpn. J. Appl. Phys., Part 1 38 (1999) 5638.
14. B. S. Kang, B. H. Park, S. D. Bu, S. H. Kang and T. W. Noh, Appl. Phys. Lett. 75 (1999) 2644.
15. B. H. Park, S. J. Hyun, S. D. Bu, T. W. Noh, J. Lee, H.-D. Kim and W. Jo, ibid. 74 (1999) 1907.