Investigation of the properties of an ion-etched plane laminar holographic grating

Applied Optics

Volumn 40, Issue 34, 2001, Pages 6157-6165

  Hunter, William R ^a   Kowalski, Michael P ^b   Rife, Jack C ^b   Cruddace, Raymond G ^b  

^a Naval Research Laboratory ^*  (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FUSED SILICA; HOLOGRAPHY; RADIATION EFFECTS;

LAMINAR GRATINGS;

DIFFRACTION GRATINGS;

EID: 0037707472     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.006157     Document Type: Article

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