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Volumn 42, Issue 5, 2003, Pages 1417-1426

Digital laser microinterferometer and its applications

Author keywords

Displacement; Laser interferometry; MEMS; Microelements; Shape; Speckle interferometry

Indexed keywords

INTERFEROMETERS; MICROELECTROMECHANICAL DEVICES; SPECKLE; STRAIN; STRESS ANALYSIS;

EID: 0037704611     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1564103     Document Type: Article
Times cited : (30)

References (11)
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  • 2
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    • Fu, Y.1    Kok, N.2    Bryan, A.3
  • 3
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    • Combination of 3-D deformation and shape measurement by electronic speckle-pattern interferometry for quantitative strain-stress analysis
    • A. Ettemeyer, "Combination of 3-D deformation and shape measurement by electronic speckle-pattern interferometry for quantitative strain-stress analysis," Opt. Eng. 39(1), 212-215 (2000).
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    • Ettemeyer, A.1
  • 4
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    • Strain analysis by means of digital shearography: Potential, limitations and demonstration
    • W. Steinchen, L. X. Yang. G. Kupfer, P. Maeckel, and F. Voessing, "Strain analysis by means of digital shearography: potential, limitations and demonstration," J. Strain Anal. Eng. Des. 33(2), 171-182 (1998).
    • (1998) J. Strain Anal. Eng. Des. , vol.33 , Issue.2 , pp. 171-182
    • Steinchen, W.1    Yang, L.X.2    Kupfer, G.3    Maeckel, P.4    Voessing, F.5
  • 5
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    • Absolute shape measurements using high-resolution optoelectronic holography methods
    • C. Furlong and R. J. Pryputniewicz, "Absolute shape measurements using high-resolution optoelectronic holography methods," Opt. Ens. 39(1), 216-223 (2000).
    • (2000) Opt. Ens. , vol.39 , Issue.1 , pp. 216-223
    • Furlong, C.1    Pryputniewicz, R.J.2
  • 6
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    • Phase-shifting speckle interferometry
    • K. Creath, "Phase-shifting speckle interferometry."Appl. Opt. 24(18), 3053-3058 (1985).
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  • 7
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    • Quantitative evaluation of the interference phase
    • Chap. 4, Akademie Verlag, Berlin
    • T. Kreis, Holographic Interferometry, Chap. 4, "Quantitative evaluation of the interference phase," Akademie Verlag, Berlin (1996).
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  • 9
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    • Precision measurement and nondestructive testing by means of digital phase shifting speckle pattern and speckle pattern shearing interferometry
    • L. X. Yang, W. Steinchen, M. Schuth, and G. Kupfer, "Precision measurement and nondestructive testing by means of digital phase shifting speckle pattern and speckle pattern shearing interferometry," Measurement 16, 149-160 (1995).
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  • 11
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    • Speckle interferometry
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.