-
1
-
-
0035479657
-
The accuracy of fast 3D topography measurements
-
R. Ohlsson, A. Wihlborg, and H. Westberg, "The accuracy of fast 3D topography measurements." Int. J. Mach. Tools Manuf. 41(13-14), 1899-1907(2001).
-
(2001)
Int. J. Mach. Tools Manuf.
, vol.41
, Issue.13-14
, pp. 1899-1907
-
-
Ohlsson, R.1
Wihlborg, A.2
Westberg, H.3
-
2
-
-
0034512455
-
Microfabrication of microlens array by focused ion beam technology
-
Y. Fu. N. Kok, and A. Bryan, "Microfabrication of microlens array by focused ion beam technology," Microelectron. Eng. 54(3-4), 211-221 (2000).
-
(2000)
Microelectron. Eng.
, vol.54
, Issue.3-4
, pp. 211-221
-
-
Fu, Y.1
Kok, N.2
Bryan, A.3
-
3
-
-
0033880136
-
Combination of 3-D deformation and shape measurement by electronic speckle-pattern interferometry for quantitative strain-stress analysis
-
A. Ettemeyer, "Combination of 3-D deformation and shape measurement by electronic speckle-pattern interferometry for quantitative strain-stress analysis," Opt. Eng. 39(1), 212-215 (2000).
-
(2000)
Opt. Eng.
, vol.39
, Issue.1
, pp. 212-215
-
-
Ettemeyer, A.1
-
4
-
-
0032019005
-
Strain analysis by means of digital shearography: Potential, limitations and demonstration
-
W. Steinchen, L. X. Yang. G. Kupfer, P. Maeckel, and F. Voessing, "Strain analysis by means of digital shearography: potential, limitations and demonstration," J. Strain Anal. Eng. Des. 33(2), 171-182 (1998).
-
(1998)
J. Strain Anal. Eng. Des.
, vol.33
, Issue.2
, pp. 171-182
-
-
Steinchen, W.1
Yang, L.X.2
Kupfer, G.3
Maeckel, P.4
Voessing, F.5
-
5
-
-
0033907602
-
Absolute shape measurements using high-resolution optoelectronic holography methods
-
C. Furlong and R. J. Pryputniewicz, "Absolute shape measurements using high-resolution optoelectronic holography methods," Opt. Ens. 39(1), 216-223 (2000).
-
(2000)
Opt. Ens.
, vol.39
, Issue.1
, pp. 216-223
-
-
Furlong, C.1
Pryputniewicz, R.J.2
-
6
-
-
84975624647
-
Phase-shifting speckle interferometry
-
K. Creath, "Phase-shifting speckle interferometry."Appl. Opt. 24(18), 3053-3058 (1985).
-
(1985)
Appl. Opt.
, vol.24
, Issue.18
, pp. 3053-3058
-
-
Creath, K.1
-
7
-
-
84877461978
-
Quantitative evaluation of the interference phase
-
Chap. 4, Akademie Verlag, Berlin
-
T. Kreis, Holographic Interferometry, Chap. 4, "Quantitative evaluation of the interference phase," Akademie Verlag, Berlin (1996).
-
(1996)
Holographic Interferometry
-
-
Kreis, T.1
-
9
-
-
0029405123
-
Precision measurement and nondestructive testing by means of digital phase shifting speckle pattern and speckle pattern shearing interferometry
-
L. X. Yang, W. Steinchen, M. Schuth, and G. Kupfer, "Precision measurement and nondestructive testing by means of digital phase shifting speckle pattern and speckle pattern shearing interferometry," Measurement 16, 149-160 (1995).
-
(1995)
Measurement
, vol.16
, pp. 149-160
-
-
Yang, L.X.1
Steinchen, W.2
Schuth, M.3
Kupfer, G.4
-
11
-
-
0002542449
-
Speckle interferometry
-
J. C. Dainty, Ed., Springer Verlag. Berlin
-
A. E. Ennos, "Speckle Interferometry," in Laser Speckle and Related Phenomena, J. C. Dainty, Ed., Springer Verlag. Berlin (1975).
-
(1975)
Laser Speckle and Related Phenomena
-
-
Ennos, A.E.1
|