Sintering of porous silicon

Physica Status Solidi (A) Applied Research

Volumn 197, Issue 1, 2003, Pages 83-87

  Muller G ^a   Nerding, M ^b   Ott, N ^b   Strunk, H P ^b   Brendel, R ^a  

^a BAVARIAN CENTER FOR APPLIED ENERGY RESEARCH ZAE BAYERN   (Germany)

^b UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMS; COMPUTER SIMULATION; DIFFUSION; INTERFACIAL ENERGY; MOLECULAR DYNAMICS; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SINTERING; TRANSMISSION ELECTRON MICROSCOPY;

PORE COARSENING; SCANNING ELECTRON MICROGRAPHS; SURFACE DIFFUSION;

POROUS SILICON;

EID: 0037701340     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssa.200306472     Document Type: Conference Paper

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