Enhancement of remanent polarization of BIT-based thin films by Ti-site substitution using ions with higher charge valences

Materials Research Society Symposium - Proceedings

Volumn 748, Issue , 2003, Pages 87-99

  Uchida, Hiroshi ^a   Okada, Isao ^a   Matsuda, Hirofumi ^b   Iijima, Takashi ^b   Watanabe, Takayuki ^c   Funakubo, Hiroshi ^c  

^a SOPHIA UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CRYSTALS; SUBSTRATES; TITANIUM;

CHARGE VALENCES;

FERROELECTRIC THIN FILMS;

EID: 0037699371     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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