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Volumn 81, Issue 2-3, 2003, Pages 323-325

TEM study of the interface in ceramic-reinforced aluminum-based composites

Author keywords

CBED; Composite materials; Electron diffraction; Lattice parameter determination

Indexed keywords

DISLOCATIONS (CRYSTALS); HIGH RESOLUTION ELECTRON MICROSCOPY; INTERFACES (MATERIALS); LATTICE CONSTANTS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0037698024     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(02)00593-X     Document Type: Conference Paper
Times cited : (24)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.