Structural and electrical characterization of magnetoresistive La0.7Ca0.3MnO3 thin films

Journal of Magnetism and Magnetic Materials

Volumn 262, Issue 1, 2003, Pages 150-153

  De Santis, A ^a   Bobba, F ^a   Cristiani, G ^b   Cucolo, A ^a   Frohlich, K ^c   Habermeier, H U ^b   Salvato, M ^a   Vecchione, A ^a  

^a UNIVERSITY OF SALERNO   (Italy)

^b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^c INSTITUTE OF ELECTRICAL ENGINEERING   (Slovakia)

Author keywords

Colossal magnetoresistance; Manganites; Thin films

Indexed keywords

ANNEALING; COLOSSAL MAGNETORESISTANCE; CRYSTAL DEFECTS; ELECTRIC PROPERTIES; LANTHANUM COMPOUNDS; MAGNETIC FIELD EFFECTS; PULSED LASER DEPOSITION; SPUTTER DEPOSITION; X RAY DIFFRACTION ANALYSIS;

MAGNETOTRANSPORT PROPERTIES;

MAGNETIC THIN FILMS;

EID: 0037696412     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(03)00039-8     Document Type: Conference Paper

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