Wideband high-frequency line-focus PVDF transducer for materials characterization

Ultrasonics

Volumn 41, Issue 3, 2003, Pages 157-161

  Zou, Wei ^a,b   Holland, Steve ^a   Kim, Kwang Yul ^a   Sachse, Wolfgang ^a  

^a Department of Obstetrics Gynecology   (United States)

^b IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ATTENUATION; PIEZOELECTRIC MATERIALS; PRODUCT DESIGN; SILICON WAFERS; THIN FILMS; WAVE PROPAGATION;

FREQUENCY SPECTRUM;

TRANSDUCERS;

EID: 0037696404     PISSN: 0041624X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0041-624X(03)00099-4     Document Type: Article

References (13)

1. Kushibiki J., Chubachi N. IEEE Trans. Sonics Ultrason. 32:1995;189.
2. Achenbach J.D., Kim J.O., Lee Y.-C. Briggs G.A.D. Advances in Acoustic Microscopy. Vol. 1:1995;153 Plenum, New York.
3. Xiang D., Hsu N.N., Blessing G.V. Ultrasonics. 34:1996;641.
4. Lemons R.A., Quate C.F. Appl. Phys. Lett. 42:1974;163.
5. Atalar A., Hoppe M. Rev. Sci. Instrum. 57:1986;2568.
6. Liang K.K., Bennett S.D., Khuri-Yakub B.T., Kino G.S. IEEE Trans. Sonics Ultrason. SU. 32:1985;266.
7. Gilmore R.S., Tam K.C., Young J.D., Howard D.R. Philos. Trans. R. Soc. London A. 302:1986;215.
8. Lockwood G.R., Hunt J.W., Foster F.S. IEEE Trans. UFFC. 38:1991;48.
9. Smolorz S., Grill W. Res. Nondestr. Eval. 7:1996;195.
10. Cook R.K. American Institute of Physics Handbook. second ed. 1963;McGraw-Hill, New York. (Chapter 3).
11. Briggs G.A.D. Acoustic Microscopy. 1992;Clarendon Press, Oxford.
12. Auld B.A. Acoustic Fields and Waves in Solids, Vol. 1. second ed. 1990;Krieger, Malabar, FL.
13. N.N. Hsu, D. Xiang, G.V. Blessing, US patent, No. 5922961, 1999.