Hard x-ray shearing interferometry

Journal De Physique. IV : JP

Volumn 104, Issue , 2003, Pages 595-598

  David, C ^a   Nohammer B ^a   Solak, H H ^a   Ziegler, E ^b  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; ELECTRON BEAM LITHOGRAPHY; ETCHING; INTEGRAL EQUATIONS; INTERFEROMETERS; LIGHT INTERFERENCE; POLYSTYRENES; SHEARING; VIBRATIONS (MECHANICAL); WAVEFRONTS; X RAY OPTICS;

BONSE-HART INTERFEROMETER; HARD X RAY SHEARING INTERFEROMETRY; MACH-ZENDER TYPE; MOIRE PATTERN; WAVEFRONT DISTORTION; WET CHEMICAL ETCHING;

INTERFEROMETRY;

EID: 0037687704     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:20030152     Document Type: Conference Paper

References (7)

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