Interface of laser deposited Cu/Ag multilayers: Evidence of the `subsurface growth mode' during pulsed laser deposition

Applied Surface Science

Volumn 154, Issue , 2000, Pages 419-423

  Fahler S ^a   Kahl, S ^a   Weisheit, M ^a   Sturm, K ^a   Krebs, H U ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; CRYSTAL GROWTH; ELECTRIC CONDUCTANCE; ELECTRIC RESISTANCE MEASUREMENT; ELECTRON DIFFRACTION; FILM GROWTH; LATTICE CONSTANTS; METALLIC FILMS; MULTILAYERS; PULSED LASER APPLICATIONS; SILVER; SPUTTER DEPOSITION;

PULSED LASER DEPOSITION (PLD);

METALLIC SUPERLATTICES;

EID: 0037683971     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00471-7     Document Type: Article

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