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Nanocrystal size, morphology, and structure were measured by TEM at the National Center for Electron Microscopy at Lawrence Berkeley Laboratory, on a JEOL CX200 and a 002b Top Con electron microscope operating at 200 kV. Ground powders were diluted in methanol in a 1:3 volume ratio, and a Cu grid covered with a 3-4 nm thick film of amorphous carbon was dipped in the solution and then allowed to dry covered by a watch glass. Due to electron scattering in the composite grains (often too thick for the electron beam) and the different focal planes of the porous structure and the metal nanoparticles, images showing both features are blurry.
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