Magnetic and structural characteristics of exchange biasing systems based on NiMn antiferromagnetic films

Journal of Magnetism and Magnetic Materials

Volumn 263, Issue 1-2, 2003, Pages 57-71

  Groudeva Zotova, S ^a,b   Elefant, D ^a   Kaltofen, R ^a   Tietjen, D ^a   Thomas, J ^a   Hoffmann, V ^a   Schneider, C M ^a  

^a IFW DRESDEN   (Germany)

^b INSTITUTE OF ELECTRONICS   (Bulgaria)

Author keywords

AFM FM bi layers; Crystalline structure; Exchange bias; Field cooling; NiMn

Indexed keywords

ANNEALING; CRYSTAL STRUCTURE; FILM GROWTH; MAGNETIC PROPERTIES; MAGNETIC THIN FILMS; OPTICAL KERR EFFECT; SPUTTER DEPOSITION; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

FIELD-COOLING;

ANTIFERROMAGNETIC MATERIALS;

EID: 0037670211     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(02)01535-4     Document Type: Article

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