Analysis of damage near a conducting crack in a piezoelectric ceramic

Acta Mechanica Solida Sinica

Volumn 16, Issue 2, 2003, Pages 147-154

  Yang, Xinhua ^a   Chen, Chuanyao ^a   Hu, Yuantai ^a,b  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b DALIAN UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

Conducting crack; Mechanical and electrical damage; Nonlinear finite element method; Piezoelectric ceramic

Indexed keywords

ELECTRIC FIELDS; ELECTRIC LOADS; ELECTROMECHANICAL DEVICES; FINITE ELEMENT METHOD; ITERATIVE METHODS; PIEZOELECTRICITY; PLATES (STRUCTURAL COMPONENTS);

ELECTRICAL DAMAGE;

CERAMIC MATERIALS;

EID: 0037658473     PISSN: 08949166     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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