Electro-optic sampling system with a single-crystal 4-N,N-dimethylamino-4′-N′-methyl-4-stilbazolium tosylate sensor

Applied Physics Letters

Volumn 82, Issue 15, 2003, Pages 2383-2385

  Zheng, X ^a   Wu, S ^a,d   Sobolewski, Roman ^a,e   Adam, R ^b   Mikulics, M ^b   Kordos P ^b   Siegel, M ^c  

^a University of Rochester   (United States)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

^c UNIVERSITY OF KARLSRUHE   (Germany)

^d UNIVERSITY OF ROCHESTER   (United States)

^e INSTITUTE OF PHYSICS   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; ELECTROOPTICAL EFFECTS; PERMITTIVITY; SALTS; SIGNAL TO NOISE RATIO; SINGLE CRYSTALS;

ELECTRIC-FIELD COUPLING;

OPTICAL SENSORS;

EID: 0037651103     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1565508     Document Type: Article

References (23)

1. S. R. Murder, J. W. Perry, and W. P. Schaefer, Science 245, 626 (1989).
2. C. P. Yakymyshyn, K. R. Stewart, E. P. Boden, S. R. Marder, J. W. Perry, and P. Schaefer, Proceeding of the Second International Symposium on Organic Materials for Non-linear Optics (Royal Society of Chemistry, Cambridge, U.K., 1991). p. 108.
3. G. Knöfple, R. Schlesser, R. Ducret, and P. Günter, Nonlinear Opt. 9, 143 (1995).
4. F. Pan, G. Knöfple, Ch. Bosshard, S. Follonier, R. Spreiter, M. S. Wong, and P. Günter. Appl. Phys. Lett. 69, 13 (1996).
5. Ch. Bosshard, R. Spreiter, and P. Günter, J. Opt. Soc. Am. B 18, 1620 (2001).
6. R. Spreiter, Ch. Bosshard, and P. Günter, Opt. Lett. 22, 564 (1997).
7. X.-C. Zhang, X. F. Ma, Y. Jin, T.-M. Lu, and E. P. Boden, Appl. Phys. Lett. 61, 3080 (1992).
8. K. Kawase, M. Mizuno, S. Sohma, H. Takahashi, T. Taniuchi, and H. Ito, Opt. Lett. 24, 1065 (1999).
9. T. J. Carrig, G. Rodriguez, T. S. Clement, A. J. Taylor, and K. R. Stewnrt, Appl. Phys. Lett. 66, 121 (1995).
10. T. J. Carrig, G. Rodriguez, T. S. Clement, A. J. Taylor, and K. R. Stewart, Appl. Phys. Lett. 66, 10 (1995).
11. P. Y. Han, M. Tani, F. Pan, and X.-C. Zhang, Opt. Lett. 25, 675 (2000).
12. M. S. Litz, D. C. Judy, G. A. Huttlin, C. Lazard, L. F. Lihelo, X.-C. Zhang, and Z. Lu, Proc. SPIE 3158, 72 (1997).
13. M. Thakur, J. Xu, A. Bhowmik, and L. Zhou, Appl. Phys. Lett. 74, 635 (1999).
14. F. Pan, K. McCullion, and M. Chiappetta, Appl. Phys. Lett. 74, 492 (1999).
15. B. Cai, T. Hattori, H. H. Deng, K. Komatsu, C. Zawadzki, N. Keil, and T. Kaino, Jpn. J. Appl. Phys. 40, L964 (2001).
16. U. Meiner, M. Bösch, Ch. Bosshard, F. Pan, and P. Günter, J. Appl. Phys. 83, 3486 (1998).
17. N. A. van Dantzig, P. C. M. Planken, and H. J. Bakker, Opt. Lett. 23, 466 (1998).
18. S. R. Forrest, P. E. Burrows, A. Stroustrup, D. Strickland, and V. S. Ban, Appl. Phys. Lett. 68, 1326 (1996).
19. F. Pan, M. S. Wong, Ch. Bosshard, and P. Günter, Adv. Mater. 8, 592 (1996).
20. J. A Valdmanis, G. Mourou, and C. W. Gabel, Appl. Phys. Lett. 41, 211 (1982).
21. X. Zheng, S. Wu, R. Adam, M. Mikulics, A. Förster, J. Schelten, M. Siegel, P. Kordos, and R. Sobolewski, Proc. SPIE 5123, 69 (2003).
22. Rainbow Photonics. Einsteinstrasse, HPF E15.2, CH-8093 Zürich, Switzerland: http://www.rainbowphotonics.ethz.ch
23. R. Adam, M. Mikulics, A. Förster, J. Schelten, M. Siegel, P. Kordos, X. Zheng, S. Wu, and R. Sobolewski, Appl. Phys. Lett. 81, 3485 (2002)