Magnetic relaxation in exchange-coupled Co/CoO bilayers measured with ac-anisotropic magnetoresistance

Journal of Applied Physics

Volumn 93, Issue 10 3, 2003, Pages 8609-8611

  Venus, D ^a   Hunte, F ^b   Krivorotov, I N ^b   Gredig, T ^b   Dan Dahlberg, E ^b  

^a MCMASTER UNIVERSITY   (Canada)

^b University of Minnesota   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; AMORPHOUS SILICON; MAGNETIC ANISOTROPY; MAGNETIC SUSCEPTIBILITY; MAGNETORESISTANCE; SILICON NITRIDE; SPUTTER DEPOSITION;

BILAYERS;

MAGNETIC RELAXATION;

EID: 0037640048     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1557793     Document Type: Conference Paper

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