Exchange bias in Co/Co3O4 bilayers

Journal of Applied Physics

Volumn 93, Issue 10 2, 2003, Pages 6587-6589

  You, Biao ^a   Wang, Yixing ^a   Zhao, Yanling ^a   Sun, Liang ^a   Sheng, Wanting ^a   Pan, Minghu ^a   Du, Jun ^a   Hu, An ^a   Lu, Mu ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

INTERDIFFUSION (SOLIDS); INTERFACES (MATERIALS); MAGNETOMETERS; PARAMAGNETISM; X RAY PHOTOELECTRON SPECTROSCOPY;

THICKNESS FLUCTUATIONS;

COBALT COMPOUNDS;

EID: 0037639693     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1543878     Document Type: Conference Paper

References (7)

1. W. H. Meiklejohn and C. P. Bean, Phys. Rev. 102, 1413 (1956).
2. T. Ambrose and C. L. Chien, J. Appl. Phys. 83, 6822 (1998).
3. S. Gangopadhyay, G. C. Hadjipanayis, C. M. Sorensen, and K. J. Klabunde, J. Appl. Phys. 73, 6964 (1993).
4. G. H. Yu, C. L. Chai, F. W. Zhu, J. M. Xiao, and W. Y. Lai, Appl. Phys. Lett. 78, 1706 (2001).
5. J. Nogués and I. K. Schuller, J. Magn. Magn. Mater. 192, 203 (1999).
6. T. Ambrose and C. L. Chien, Phys. Rev. Lett. 76, 1743 (1996).
7. H. Sang, Y. W. Du, and C. L. Chien, J. Appl. Phys. 85, 4931 (1999).