X-ray diffraction and ferromagnetic resonance study of sputtered (110) GaAs/Fe epitaxial films

Journal of Applied Physics

Volumn 93, Issue 10 2, 2003, Pages 6674-6676

  Ding, Yunfei ^a   Alexander Jr , Chester ^a   Klemmer, Timothy J ^b  

^a University of Alabama   (United States)

^b SEAGATE RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FERROMAGNETIC RESONANCE; MAGNETIC ANISOTROPY; MAGNETRON SPUTTERING; MOLECULAR BEAM EPITAXY; SEMICONDUCTING GALLIUM ARSENIDE; SINGLE CRYSTALS; TENSILE STRESS; X RAY DIFFRACTION ANALYSIS;

EPITAXIAL FILMS;

MAGNETIC THIN FILMS;

EID: 0037639128     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1556100     Document Type: Conference Paper

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