ARET for system-level IC reliability simulation

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2003, Pages 572-573

  Xuan, Xiangdong ^a   Chatterjee, Abhijit ^a   Singh, Adit D ^b  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b AUBURN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; INTEGRATED CIRCUIT LAYOUT; RELIABILITY; THERMAL STRESS;

ELECTRICAL STRESS;

INTEGRATED CIRCUITS;

EID: 0037634336     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)