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Volumn 41, Issue 1, 1996, Pages 174-177
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Pt/SrBi4Ti4O15/Si-MOS system: Preliminary study employing an inverted MOS configuration
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Author keywords
Bismuth layered structure ferroelectrics; Eclipse pulsed laser deposition method; Metal oxide semiconductor system; Oxide films
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Indexed keywords
BISMUTH;
ELECTRODES;
EXPERIMENTS;
METALLIC FILMS;
PULSED LASER APPLICATIONS;
SEMICONDUCTOR MATERIALS;
ECLIPSE PULSED LASER DEPOSITION METHOD;
METAL OXIDE SEMICONDUCTOR DEVICE;
OXIDE FILMS;
MOS DEVICES;
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EID: 0037630595
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-5107(96)01647-9 Document Type: Article |
Times cited : (3)
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References (5)
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