STM observations of a one-dimensional electronic edge state at steps on Cu(111)

Physical Review B - Condensed Matter and Materials Physics

Volumn 67, Issue 20, 2003, Pages

  Bartels, Ludwig ^a   Hla, S W ^b   Kuhnle A ^c,e   Meyer, G ^c,f   Rieder, K H ^c   Manson, J R ^d  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b OHIO UNIVERSITY   (United States)

^c FREIE UNIVERSITÄT BERLIN   (Germany)

^d CLEMSON UNIVERSITY   (United States)

^e AARHUS UNIVERSITY   (Denmark)

^f IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER;

ARTICLE; ELECTRON; ELECTRONICS; ENERGY; IMAGE ANALYSIS; IMAGE QUALITY; OSCILLATION; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTY;

EID: 0037626670     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.67.205416     Document Type: Article

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