ISO long wavelength spectrometer parallel mode

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4847, Issue , 2002, Pages 277-284

  Lim, Tanya L ^a   Vivares, Florence ^b   Swinyard, Bruce M ^a   Caux, Emmanuel ^c  

^a RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^b SEMA Group   (France)

^c IRAP   (France)

Author keywords

Data Processing; Infrared; ISO LWS

Indexed keywords

BANDWIDTH; CAMERAS; DATA PROCESSING; DIFFRACTION GRATINGS; PHOTOMETERS;

LONG WAVELENGTH SPECTROMETERS (LWS);

SPECTROMETERS;

EID: 0037625790     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.461014     Document Type: Conference Paper

References (5)

1. P. E. Clegg, et al, "The ISO Long-Wavelength Spectrometer", A & A, 315, pp L38-42, 1996
2. M.J. Burgdorf, et al, "Automatic data processing and quality control experiences from ISO-LWS", SPIE, 3349, pp 359-367, 1998
3. T.L. Lim, et al, "Long-term performance of doped Ge:Ga photoconductors in the space environment", SPIE, 3354, pp 347-356, 1998
4. C. Gry, "Wavelength Calibration and instrumental profiles of the ISO-LWS grating", ESA-SP 481, In Press
5. C. Lloyd, "The ISO LWS Beam Profile", ESA-SP 481, In Press