Size-selective measurements of silicon-cluster polarizabilities by a cluster-beam deflection technique

Surface Review and Letters

Volumn 3, Issue 1, 1996, Pages 371-375

  Woenckhaus, J ^a   Schafer R ^a   Becker, J A ^a  

^a PHILIPPS UNIVERSITY MARBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037618420     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X9600067X     Document Type: Article

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