On the sensitivity of cryogenic current comparators: Theory and experiments

Metrologia

Volumn 40, Issue 2, 2003, Pages 51-56

  Rillo, C ^a   Sese J ^b   Bartolome E ^b   Flokstra, J ^b   Camon A ^a   Rietveld, G ^c  

^a CSIC   (Spain)

^b UNIVERSITY OF TWENTE   (Netherlands)

^c NMi Van Swinden Laboratorium   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC TRANSFORMERS; SENSITIVITY ANALYSIS; SQUIDS;

CRYOGENIC CURRENT COMPARATORS (CCC);

CRYOGENIC EQUIPMENT;

EID: 0037614703     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/40/2/308     Document Type: Article

References (15)

1. Harvey I K 1972 Rev. Sci. Instrum. 43 1626-9
2. Jeckelmann B and Jeanneret B 2001 Rep. Prog. Phys. 64 1603-55
3. Hartland A 1993 Conf. Electrom. Meas. BEMC 18 1-4
4. de Wilde Y, Gay F, Piquemal F and Geneves G 2001 IEEE Trans. Instrum. Meas. 50 231-4
5. Bartolomé E, Sesé J. Rietveld G, Flokstra J, Rillo C, Camón A and Rogalla H 2002 CPEM2002 Digest 280-1
6. Bartolomé E 2002 PhD Thesis University of Twente, The Netherlands
7. Sesé J, Lera F, Camon A and Rillo C 1999 IEEE Trans. Appl. Supercon. 9 58-62
8. Frantsuz E T 1998 Metrologia 35 847-51
9. Sesé J, Camón A, Rietveld G and Rillo C 1999 IEEE Trans. Instrum. Meas. 48 1306-13
10. Early M D and Jones K 1997 IEEE Trans. Instrum. Meas. 46 459-62
11. Early M D and van Dam M A 1999 IEEE Trans. Instrum. Meas. 48 379-82
12. Sesé J 1999 PhD Thesis University of Zaragoza, Spain
13. Wood B M Private communication
14. Jeckelmann B Private communication
15. Sesé J, Bartolomé E, Flokstra J, Rietveld G, Camón A and Rillo C 2003 IEEE Trans. Instrum. Meas. at press