The dynamics of silicon deposition in the sorghum root endodermis

New Phytologist

Volumn 158, Issue 3, 2003, Pages 437-441

  Lux, Alexander ^a   Luxová, Miroslava ^b   Abe, Jun ^c   Tanimoto, Eiichi ^d   Hattori, Taiichiro ^e   Inanaga, Shinobu ^e  

^a Physics and Informatics   (Slovakia)

^b INSTITUTE OF BOTANY   (Slovakia)

^c UNIVERSITY OF TOKYO   (Japan)

^d NAGOYA CITY UNIVERSITY   (Japan)

^e TOTTORI UNIVERSITY   (Japan)

Author keywords

Endodermis; Environmental scanning electron microscope (ESEM); Root; Silicon (Si) deposition; Sorghum bicolor (sorghum); X ray microanalysis

Indexed keywords

ROOT; SILICA;

SORGHUM BICOLOR;

EID: 0037610289     PISSN: 0028646X     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1469-8137.2003.00764.x     Document Type: Article

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