Yield stress measurement of silicon nitride suspensions

Canadian Journal of Chemical Engineering

Volumn 80, Issue 6, 2002, Pages 1175-1180

  Zhu, Lixuan ^a   Papadopoulos, Kyriakos ^a   De Kee, Daniel ^a  

^a Tulane University   (United States)

Author keywords

Silicon nitride; Suspensions; Yield stress

Indexed keywords

CREEP TESTING; RHEOMETERS; SILICON NITRIDE; YIELD STRESS;

STATIC YIELD STRESS;

SUSPENSIONS (FLUIDS);

ALUMINUM OXIDE; SILICON NITRIDE;

MEASUREMENT METHOD; RHEOMETER; SILICON NITRIDE; STRESS; SUSPENSION; TEMPERATURE EFFECT;

ARTICLE; CONCENTRATION (PARAMETERS); DEVICE; DYNAMICS; FLOW MEASUREMENT; FLOWMETER; INTERMETHOD COMPARISON; PARTICULATE MATTER; PHYSICAL STRESS; SUSPENSION; TEMPERATURE; VELOCITY;

EID: 0037600523     PISSN: 00084034     EISSN: None     Source Type: Journal    
DOI: 10.1002/cjce.5450800619     Document Type: Article

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