Plan-view observation of crack tips by focused ion beam/transmission electron microscopy

Materials Science and Engineering: A

Volumn 234-236, Issue , 1997, Pages 552-554

  Saka, H ^a   Abe, S ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

Crack; Focused ion beam; Plan view observation; Transmission electron microscopy

Indexed keywords

DISLOCATIONS (CRYSTALS); HEATING; ION BEAMS; SILICON; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

FOCUSED ION BEAM TECHNIQUE; POST MORTEM HEATING; VICKERS INDENTATION;

CRACKS;

EID: 0037589544     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0921-5093(97)00289-x     Document Type: Article

References (6)

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6. R.F. Cook, G.M. Pharr, J. Am. Cera. Soc., 73 (1990) 787.