Reliability physics study for semiconductor-polymer device development

Microelectronics Journal

Volumn 34, Issue 5-8, 2003, Pages 713-715

  Teixeira, Dyanna G D ^a   Laranjeira, Jane M G ^a   De Vasconcelos, Elder A ^a   Da Silva Jr , Eronides F ^a   De Azevedo, Walter M ^a   Khoury, Helen J ^a  

^a FEDERAL UNIVERSITY OF PERNAMBUCO   (Brazil)

Author keywords

Fabrication; Reliability physics; Silicon polyaniline heterojunctions

Indexed keywords

CHEMICAL SENSORS; DEGRADATION; HETEROJUNCTIONS; SEMICONDUCTING SILICON;

RELIABILITY PHYSICS;

POLYMERS;

EID: 0037567221     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2692(03)00109-5     Document Type: Conference Paper

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