The BIPM laser standards at 633 nm and 532 nm simultaneously linked to the SI second using a femtosecond laser in an optical clock configuration

IEEE Transactions on Instrumentation and Measurement

Volumn 52, Issue 2, 2003, Pages 232-235

  Ma, Long Sheng ^a,b   Robertsson, Lennart ^a   Picard, Susanne ^a   Chartier, Jean Marie ^a   Karlsson, Helge ^c   Prieto, Emilio ^d   Windeler, Robert S ^e  

^a PAVILLON DE BRETEUIL   (France)

^b EAST CHINA NORMAL UNIVERSITY   (China)

^c NMAS   (Norway)

^d Centro Espanol de Metrologia   (Spain)

^e OFS LABORATORIES   (United States)

Author keywords

Femtosecond laser; Frequency measurement; Frequency standards; Iodine; Optical comb generator; YAG laser

Indexed keywords

FREQUENCY STANDARDS; HELIUM NEON LASERS; IODINE; MASERS; NEODYMIUM LASERS; OPTICAL VARIABLES MEASUREMENT; SPURIOUS SIGNAL NOISE; ULTRAFAST PHENOMENA;

FEMTOSECOND LASER; FREQUENCY MEASUREMENT; OPTICAL CLOCK CONFIGURATION; OPTICAL COMB GENERATOR; YTTRIUM ALUMINUM GARNET LASER;

LASER APPLICATIONS;

EID: 0037561506     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2003.811688     Document Type: Article

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