SCOPUS 정보 검색 플랫폼

Microelectronics Reliability

Volumn 42, Issue 9-11, 2002, Pages 1771-1776

Reliability of MEMS - A methodical approach

(3) Muller Fiedler R a Wagner, U a Bernhard, W a

a ROBERT BOSCH GMBH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSENSORS;

COMPLEX FUNCTIONS; DYNAMIC MECHANICAL; ELECTRONIC CONTROL UNITS; HARSH ENVIRONMENT; METHODICAL APPROACH; MICRO-SYSTEM TECHNOLOGIES; MOTOR MANAGEMENT; RESEARCH ACTIVITIES;

RELIABILITY;

EID: 0037555861 PISSN: 00262714 EISSN: None Source Type: Journal
DOI: 10.1016/S0026-2714(02)00229-9 Document Type: Conference Paper

Times cited : (23)

References (8)

1
- 80054954017
- The automotive microsystems market: Insights from the nexus market study 2001
- Springer Verlag (Berlin,)
- H. Wicht, M. Illing, R. Wechsung, "The Automotive Microsystems Market: Insights from the Nexus Market Study 2001", Advanced Microsystems for Automotive Applications, Yearbook 2002, Springer Verlag (Berlin, 2002) 13
- (2002) Advanced Microsystems for Automotive Applications, Yearbook 2002 , pp. 13
- Wicht, H.¹ Illing, M.² Wechsung, R.³

2
- 0012526042
- Overview of automotive sensors
- W. J. Fleming, "Overview of Automotive Sensors", IEEE Sensors Journal, vol. 1, no. 4 (2001) 296
- (2001) IEEE Sensors Journal , vol.1 , Issue.4 , pp. 296
- Fleming, W.J.¹

3
- 33846359007
- Markets and opportunities for MEMS/MST in automotive applications
- Springer Verlag (Berlin,)
- R. Grace, "Markets and Opportunities for MEMS/MST in Automotive Applications", Advanced Microsystems for Automotive Applications, Yearbook 2002, Springer Verlag (Berlin, 2002) 3
- (2002) Advanced Microsystems for Automotive Applications, Yearbook 2002 , pp. 3
- Grace, R.¹

4
- 0035767660
- Reliability of Mi-croelectromechanical systems (MEMS)
- Reliability, Testing, and Characterization of MEMS/MOEMS, R. Ramesham (ed.)
- S. Tadigadapa, N. Najafi, "Reliability of Mi-croelectromechanical Systems (MEMS)", Reliability, Testing, and Characterization of MEMS/MOEMS, R. Ramesham (ed.), Proc. SPIE Vol. 4558 (2001) 197-205
- (2001) Proc. SPIE , vol.4558 , pp. 197-205
- Tadigadapa, S.¹ Najafi, N.²

5
- 0038570073
- Design for reliability of MEMS/MOEMS for lightwave telecommunications
- DOI 10.1117/12.442996
- S. Arney, V.A. Aksyuk, D.J. Bishop, C.A. Bolle, R.E. Frahm, A. Gasparyan, C.R. Giles, S. Goyal, F. Pardo, H.R. Shea, M.T. Lin, CD. White, "Design for Reliability of MEMS/MOEMS for Lightwave Telecommuni-cations", Reliability, Testing, and Characterization of MEMS/MOEMS, R. Ramesham (ed.), Proc. SPIE Vol. 4558 (2001) 6-10 (Pubitemid 35187346)
- (2001) Proceedings of SPIE - The International Society for Optical Engineering , vol.4558 , pp. 6-10
- Arney, S.¹ Aksyuk, V.A.² Bishop, D.J.³ Bolle, C.A.⁴ Frahm, R.E.⁵ Gasparyan, A.⁶ Giles, C.R.⁷ Goyal, S.⁸ Pardo, F.⁹ Shea, H.R.¹⁰ Lin, M.T.¹¹ White, C.D.¹²

6
- 0003916026
- Academic Press, San Diego
- M. Ohring: Reliability and Failure of Electronic Materials and Devices, Academic Press, San Diego (1998)
- (1998) Reliability and Failure of Electronic Materials and Devices
- Ohring, M.¹

7
- 0035457041
- Mechanical reliability of MEMS-structures under shock load
- DOI 10.1016/S0026-2714(01)00173-1, PII S0026271401001731
- th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (2001) p. 1657-62 (Pubitemid 33147550)
- (2001) Microelectronics Reliability , vol.41 , Issue.9-10 , pp. 1657-1662
- Wagner, U.¹ Franz, J.² Schweiker, M.³ Bernhard, W.⁴ Muller-Fiedler, R.⁵ Michel, B.⁶ Paul, O.⁷

8
- 0005528367
- Physics of semiconductor sensors
- H.-P. Trah, J. Franz, J. Marek, "Physics of Semiconductor Sensors", Advances in Solid State Physics, vol. 39 (1999) 25-36.
- (1999) Advances in Solid State Physics , vol.39 , pp. 25-36
- Trah, H.-P.¹ Franz, J.² Marek, J.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.