Significance of crystallographic grain orientation for oxide scale formation on FeCrAI ODS alloys studied by AFM and MCs+-SIMS

Materials at High Temperatures

Volumn 17, Issue 1, 2000, Pages 159-163

  Tyagi, A K ^a   Szot, K ^a   Czyrska Filemonowicz, A ^b   Naumenko, D ^c   Quadakkers, W J ^c  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b UNIVERSITY OF SILESIA   (Poland)

^c AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

Author keywords

AFM; Crystallographic orientation; Fccral; ODS; Oxidation; Oxide grain size; SIMS

Indexed keywords

EID: 0037542722     PISSN: 09603409     EISSN: None     Source Type: Journal    
DOI: 10.1179/mht.2000.023     Document Type: Article

References (11)

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