Evaluation of silicon twinning in hypo-eutectic Al-Si alloys

Materials Transactions

Volumn 44, Issue 4, 2003, Pages 625-628

  Nogita, Kazuhiro ^a   Drennan, John ^a   Dahle, Arne Kristian ^a  

^a UNIVERSITY OF QUEENSLAND   (Australia)

Author keywords

Aluminium silicon alloys; Eutectic silicon; Modification; Transmission electron microscopy; Twin; X ray diffractometry

Indexed keywords

ADDITION REACTIONS; CHEMICAL MODIFICATION; CRYSTAL MICROSTRUCTURE; EUTECTICS; INTERFACES (MATERIALS); MORPHOLOGY; OPTICAL MICROSCOPY; THERMOANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; TWINNING; X RAY DIFFRACTION ANALYSIS;

HYPO EUTECTICS ALUMINUM SILICON ALLOYS; SILICON TWINNING; TWIN DENSITIES; TWIN PLANE RE ENTRANT EDGE;

ALUMINUM ALLOYS;

EID: 0037530180     PISSN: 13459678     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans.44.625     Document Type: Article

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