The problem of subrayleigh resolution in interference microscopy

Journal of Russian Laser Research

Volumn 24, Issue 3, 2003, Pages 220-236

  Andreev, V A ^a   Indukaev, K V ^a  

^a AMPHORA Labs Co Ltd   (Russian Federation)

Author keywords

Diffraction limit; Optical interferometric microscopy; Subwavelength resolution; Topological phases

Indexed keywords

EID: 0037527884     PISSN: 10712836     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1024099725192     Document Type: Article

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