Advanced profile gauge for multiphase systems

1st World Congress on Industrial Process Tomography

Volumn , Issue , 1999, Pages 126-132

  Schuller R B ^a   Halleraker, M ^b   Engebretsen, B ^b  

^a NORWEGIAN UNIVERSITY OF LIFE SCIENCES   (Norway)

^b Sentech AS   (Norway)

Author keywords

Capacitance; Interface; Oscillator; Separator

Indexed keywords

CAPACITANCE; DIELECTRIC PROPERTIES; ELECTRODES; EMULSIFICATION; GAGES; INTERFACES (MATERIALS); OSCILLATORS (ELECTRONIC); SEPARATORS;

ATMOSPHERIC SYSTEMS; DIELECTRIC MEASUREMENTS; EMULSION LAYERS; INTERNAL DIAMETERS; MEASURING SYSTEMS; MULTI PHASE SYSTEMS; WATER PHASE;

PHASE INTERFACES;

EID: 0037521396     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. Ø Isaksen, A S Dico and E A Hammer, "A capacitance-based tomographic system for interface measurement in separation vessels", Meas.Sci.Technol., 5 No. 10 (1994).
2. Ø Isaksen and J E Nordtvedt, "Capacitance Tomography: Reconstruction Based on Op- timization Theory", ECAPT, Process Tomography a strategy for industrial exploitation, The Castlefield Hotel, Manchester, United Kingdom, 26th-29th March, pp 178-189, 1992.
3. Private communication with Arne Valle, Research Centre Porsgrunn, Norsk Hydro ASA, Porsgrunn, Norway, 1998.
4. T U Hersberger, Ph Rudolf von Rohr and A Neukomm, "A non-intrusive, high-speed system for measuring void fraction fluctua- tions in annular flow", Two-Phase Flow Modelling and Experimentation 1995, G.O. Celata and R.K.Shah (Editors), 1995 Edizioni ETS.
5. F N Toth, G C M Meijer and M van der Lee, "A Planar Capacitive Precision Gauge for Liquid-Level and Leakage Detection", IEEE Instrumentation and Measurement, (1997) 46 (2) 644-46.