Structural and morphological analyses of tungsten oxide nanophasic thin films obtained by MOCVD

Surface Science

Volumn 532-535, Issue , 2003, Pages 439-443

  Barreca, D ^a   Bozza, S ^b   Carta, G ^b   Rossetto, G ^b   Tondello, E ^c   Zanella, P ^b  

^a CNR Consiglio Nazionale delle Ricerche   (Italy)

^b CNR   (Italy)

^c UNIVERSITY OF PADOVA   (Italy)

Author keywords

Chemical vapor deposition; Scanning electron microscopy (SEM); Surface structure, morphology, roughness, and topography; Tungsten oxide; X ray photoelectron spectroscopy

Indexed keywords

METALLORGANIC CHEMICAL VAPOR DEPOSITION; NANOSTRUCTURED MATERIALS; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; TUNGSTEN COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

NANOPHASIC THIN FILMS;

THIN FILMS;

EID: 0037508687     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00215-2     Document Type: Conference Paper

References (10)

1. Erben S., Muehlratzer A., Tihanyi B., Cornils B. Sol. Energy Mater. 9:1983;281.
2. Yous B., Robin S., Donnadieu A., Dufour G., Maillot C., Roulet H., Senemaud C. Mater. Res. Bull. 19:1984;1349.
3. Davazoglou D., Donnadieu A. Thin Solid Films. 147:1987;131.
4. Svensson J.S.E.M., Granqvist C.G. Thin Solid Films. 126:1985;31.
5. International Centre for Diffraction Data (ICDD), PDF-2 Powder Diffraction File Database Set # 46, ICDD, Newton Square, PA, 1996.
6. Booth J., Ekström T., Iguchi E., Tilley R.J.D. J. Solid State Chem. 41:1982;293.
7. Fleisch T.H., Mains G.J. J. Chem. Phys. 76:1982;780.
8. Sarma D.D., Rao C.N.R. J. Electron Spectrosc. Relat. Phenom. 20:1980;25.
9. Biloen P., Pott G.T. J. Catal. 30:1973;169.
10. Moulder J.F., Stickle W.F., Sobol P.W., Bomben K.D. Handbook of X-ray Photoelectron Spectroscopy. 1992;Perkin-Elmer, Eden Prairie, MN.