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Volumn 532-535, Issue , 2003, Pages 1121-1126
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Investigation of the surface topography and double layer characteristics of variously pre-treated antimony single crystal electrodes
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Author keywords
Atomic force microscopy; Electrochemical methods; Low index single crystal surfaces; Scanning tunneling microscopy; Stepped single crystal surfaces; Surface structure, morphology, roughness, and topography
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTRODES;
MORPHOLOGY;
SCANNING TUNNELING MICROSCOPY;
SINGLE CRYSTALS;
SURFACE TOPOGRAPHY;
ELECTRICAL DOUBLE LAYER;
ANTIMONY;
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EID: 0037507651
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(03)00209-7 Document Type: Conference Paper |
Times cited : (9)
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References (22)
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