Non-invasive process imaging - Principles and applications of industrial process tomography

Chemical Engineering and Technology

Volumn 26, Issue 6, 2003, Pages 697-706

  Dyakowski, Tomasz ^a   Jaworski, Artur J ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL PLANTS; CHEMICAL SENSORS; CONTROL SYSTEM ANALYSIS; IMAGING SYSTEMS; TOMOGRAPHY;

INDUSTRIAL PROCESSES;

CHEMICAL ENGINEERING;

CHEMICAL INDUSTRY; CONTROL SYSTEM; IMAGING METHOD; MONITORING SYSTEM; PROCESSING TECHNIQUE; TOMOGRAPHY;

EID: 0037487195     PISSN: 09307516     EISSN: None     Source Type: Journal    
DOI: 10.1002/ceat.200390107     Document Type: Article

References (23)

1. Process Tomography - Principles, Techniques and Applications (Eds: R. A. Williams, M. S. Beck), Butterworth-Heinemann, Oxford 1995.
2. A. Plaskowski, M. S. Beck, R. Thorn, T. Dyakowski, Imaging Industrial Flows, IOP Publishing, Bristol 1995.
3. T. Dyakowski, L. F. C. Jeanmeure, A. J. Jaworski. Powder Technol. 2000. 112, 174.
4. J. S. Halow, P. Nicoletti, Powder Technol. 1992, 69, 255.
5. R. Mann, S. Stanley, D. Vlaev, E. Wabo, K. Primrose, J. Electronic Imaging 2001, 10 (.3), 620.
6. M. Wang, A. Dorward, D. Vlaev, R. Mann, Chem. Eng. J. 2000, 77 (1), 93.
7. T. Dyakowski, S. P. Luke, K. L. Ostrowski, R. A. Williams, Powder Technol. 1999, 104 (3), 287.
8. S. J. Carey, H. McCann, F. P. Hindle, K. B. Ozanyan, D. E. Waterbone, E. Clough, Chem. Eng. J. 2000, 77 (1-2), 111.
9. A. Katsuhiro, M. Masao, Mol. Crystals and Liquid Crystals Sci. and Tech. Sec. A Mol. Crystals and Liquid Crystals 1998. 314, 191.
10. N. H. Abel, J. Reine Angew Math 1826, 1, 311.
11. J. Radon, Ber. Saechs. Akad. Wiss. 1917, 69, 262.
12. Bartholomew, Casagrande, Ind. Eng. Chem. 1957, 49 (3), 428.
13. Br. J. Radiol. 1973, 46, 1016.
14. T. Grassler, K.-E. Wirth. Chem. Eng. J. 2000. 77, 65.
15. Ø. Isaksen, Meas. Sci. Technol. 1996. 7, 325.
16. S. Liu, L. Fu, W. Q. Yang, Meas. Sci. Technol. 1996. 10, 7.
17. nd World Congress on Industrial Process Tomography, Hannover, Germany, 29-31 August 2001, 4.
18. T. Dyakowski, S. J. Wang, D. Geldart, M. S. Beck, Chem. Eng. Comm. 1998, 175, 117.
19. S. A. Russel, D. G. Robertson, J. H. Lee, B. A. Ogunnaike. Chem. Eng. Sci. 1998, 53 (21), 3685.
20. T. Dyakowski, T. York, M. Mikos, D. Vlaev, R. Mann, G. Follows, A. Boxman, M. Wilson, Chem. Eng. J. 2000, 77 (1-2), 105.
21. T. U. Gerngross, S. C. Slater, Sci. Am. 2000, August, 37.
22. nd World Congress on Industrial Process Tomography. Hannover, Germany, 29-31 August, 2001.
23. A. J. Jaworski, T. Dyakowski, Meas. Sci. Technol. 2001. 12 (8), 1109.