Monte Carlo analysis of the influence of dc conditions on the upconversion of generation-recombination noise in semiconductors

Semiconductor Science and Technology

Volumn 16, Issue 2, 2001, Pages

  Perez S ^a   Gonzalez T ^a   Delage, S L ^b   Obregon, J ^c  

^a UNIVERSITY OF SALAMANCA   (Spain)

^b THALES   (France)

^c UNIVERSITY OF LIMOGES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CURRENTS; ELECTRIC FIELD EFFECTS; MONTE CARLO METHODS; SEMICONDUCTOR MATERIALS; SPURIOUS SIGNAL NOISE;

HARMONIC DISTORTION; RECOMBINATION NOISE;

FREQUENCY CONVERTER CIRCUITS;

EID: 0037486147     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/16/2/102     Document Type: Article

References (10)

1. Siweris H and Schieck B 1985 IEEE Trans. Microw. Theory Technol. 33 233
2. Tutt M N, Pavlidis D, Khatizadeh A and Bayraktaroglu B 1995 IEEE Trans. Microw. Theory Technol. 43 1461
3. Darabi H and Abidi A A 2000 IEEE J. Solid-State Circuits 33 15
4. Pérez S, González T, Delage S L and Obregon J 2000 J. Appl. Phys. 50 356
5. Persano-Adorno D, Zarcone M and Ferrante G 2000 Laser Phys. 10 310
6. Danneville F, Dambrine G and Cappy A 1998 IEEE Trans. Electron Devices 45 2207
7. Bonani F, Ghione G, Donati S, Varani L and Reggiani L 1997 Noise in Physical Systems and 1/f Fluctuations ed C Claeys and E Simoen (Singapore: World Scientific)
8. Press W H, Flannery B P, Teukolsky S A and Vetterling W T 1992 Numerical Recipes (New York: Cambridge University Press)
9. Obregon J, Prigent M, Nallatamby J C, Camiade M, Rigaud D and Quere R 2000 Workshop on Microwave Oscillators: Proc. IEEE MTT-S Int. Microwave Symp. (Boston, MA, 2000) p 89
10. Hooge F N, Kleinpenning T G M and Vandamme L K J 1981 Rep. Prog. Phys. 44 31