Uncertainty in resistance measurements based on microcontrollers with embedded time counters

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 2003, Pages 1078-1082

  Jordana, Josep ^a   Reverter, Ferran ^a   Pallàs Areny, Ramon ^a  

^a UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; ELECTRIC POWER SUPPLIES TO APPARATUS; ELECTRIC RESISTANCE; ELECTRIC VARIABLES MEASUREMENT; RESISTORS; SPURIOUS SIGNAL NOISE; CALIBRATION; CONTROLLERS; COUNTING CIRCUITS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC POWER SYSTEMS; ELECTRIC RESISTANCE MEASUREMENT; MICROCONTROLLERS; TIME MEASUREMENT;

RESISTANCE MEASUREMENTS;

MICROCONTROLLERS; UNCERTAINTY ANALYSIS;

CHARGE MEASUREMENTS; ELECTRICAL RESISTANCE MEASUREMENT; POWER SUPPLY; POWER SUPPLY DECOUPLING; POWER-SUPPLY NOISE; RELATIVE ERRORS; RESISTANCE MEASUREMENT; STANDARD DEVIATION;

EID: 0037484151     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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7. J. Jordana, F. Reverter, O. Casas, R. Pallàs-Areny. Uncertainty in resistance-to-code converters based on microcontrollers measuring time intervals. IFSA Wokshop on Programmable Devices and Systems, PDS-2003, Ostrava (Czech Rep.), February 11-13, 2003.
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9. F. Reverter, J. Jordana, R. Pallàs-Areny. Program-dependent uncertainty in period-to-code converters based on counters embedded in microcontrollers. Proc. IEEE IMTC 2003 (this conference, paper IMTC-7310)