Particular characteristics associated with temporary and permanent fault on the multi-shot reclosing scheme

Proceedings of the IEEE Power Engineering Society Transmission and Distribution Conference

Volumn 1, Issue , 2000, Pages 421-424

  Oh, Jung Hwan ^a   Yun, Sang Yun ^a   Kim, Jae Chul ^b   Kim, Eung Sang ^b  

^a Soongsil University   (South Korea)

^b Korea Electrotechnology Research Institute (KERI)   (South Korea)

Author keywords

Fourier analysis; Reclosing scheme; Temporary and permanent faults

Indexed keywords

ELECTRIC FAULT CURRENTS; ELECTRIC POWER DISTRIBUTION; FOURIER TRANSFORMS; HARMONIC DISTORTION; WAVEFORM ANALYSIS;

PERMANENT FAULTS; RECLOSING SCHEME; TEMPORARY FAULTS;

ELECTRIC POWER SYSTEMS;

EID: 0037479783     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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