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Volumn 90, Issue 4, 2003, Pages 455011-455014

Optical manipulation of defects in a lyotropic lamellar phase

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; DEFECTS; ELASTIC MODULI; LASERS; METALS; OPTICAL MICROSCOPY; RHEOLOGY; SEMICONDUCTOR MATERIALS; VISCOSITY;

EID: 0037473897     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (37)

References (19)
  • 3
  • 4
    • 0012229186 scopus 로고    scopus 로고
    • note
    • We call a linelike defect created by the motion of a bead a line defect, although, strictly speaking, it should be called, e.g., a defect loop.
  • 15
    • 0012323787 scopus 로고    scopus 로고
    • note
    • If we try to move a bead across the line defect formed by itself, we always fail This is again because we can never break up membranes (or induce topological change of membranes) with our limited optical trapping power. Since the membranes between the bead and the line defect are on the same height, the motion of a bead across the line defect formed by itself inevitably requires the reorganization of membranes accompanying the topological change, which is energetically prohibited.
  • 16
    • 0012332808 scopus 로고    scopus 로고
    • note
    • This value of κ was estimated by our independent experiment for the same system.
  • 17
    • 0012280754 scopus 로고    scopus 로고
    • note
    • T and the theoretical prediction in Fig. 2 suggests the validity of our assumptions; for example, (i) the singular parts in Fig. l(b) may be avoided without costing large elastic energy, and (ii) the resulting layer-compression energy is also considerably smaller than the bending one. This may be a unique feature of lyotropic smectics having an extra degree of freedom, concentration. Although the above assumptions may be valid for a single isolated line defect, the layer-compression energy is important when we consider the interaction between line defects (see [18]), and it may also play a significant role around the bead.
  • 18
    • 0012269446 scopus 로고    scopus 로고
    • note
    • -1.
  • 19
    • 0012229187 scopus 로고    scopus 로고
    • note
    • r < 0.5 μm, which is consistent with the observed sharp kink at the detached point of an adhered line defect [see Fig. 4(a)].


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.