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Volumn 78, Issue 3, 2003, Pages 840-846

Micro-structural characterization of annealed cadmium-zinc oxide thin films obtained by spray pyrolysis

Author keywords

Cadmium zinc oxides; Micro structural characterization; Optical properties; Thin films

Indexed keywords

ANNEALING; CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; GRAIN SIZE AND SHAPE; LATTICE CONSTANTS; PYROLYSIS; SEMICONDUCTING CADMIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

EID: 0037469532     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(02)00395-4     Document Type: Article
Times cited : (28)

References (12)
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    • (1990) J. Electron Mater. , vol.19 , pp. 1003-1005
    • Chu, T.L.1    Chu, S.S.2
  • 2
  • 7
    • 0011885758 scopus 로고    scopus 로고
    • Bruker AXS, Siemens (Diffract-AT, Profile)
    • Socabim Software, Bruker AXS, Siemens (Diffract-AT, Profile), 1996.
    • (1996) Socabim Software
  • 8
    • 0011899050 scopus 로고    scopus 로고
    • Bruker AXS, Siemens (Winmetric, Wincrysize)
    • Sigma-c.GmbH Software, Bruker AXS, Siemens (Winmetric, Wincrysize), 1996.
    • (1996) Sigma-c.GmbH Software
  • 10
    • 0022078768 scopus 로고
    • Analysis of the broadening of power diffraction peaks for ZnO: A test case
    • Louër D. Analysis of the broadening of power diffraction peaks for ZnO: a test case. Chem. Scripta A. 26:1989;17-22.
    • (1989) Chem. Scripta A , vol.26 , pp. 17-22
    • Louër, D.1
  • 11
    • 84974307935 scopus 로고
    • Application of total pattern fitting to a study of crystallite size and strain in zinc oxide powder
    • Langford J.I., Louër D., Sonneveld E.J., Visser J.W. Application of total pattern fitting to a study of crystallite size and strain in zinc oxide powder. Powder Diffr. 1:1986;211-221.
    • (1986) Powder Diffr. , vol.1 , pp. 211-221
    • Langford, J.I.1    Louër, D.2    Sonneveld, E.J.3    Visser, J.W.4
  • 12
    • 0003538543 scopus 로고
    • International union of crystallography
    • Oxford University Press, Oxford
    • R.A. Young (Ed.), International Union of Crystallography, The Rietveld Method, Oxford University Press, Oxford, 1993.
    • (1993) The Rietveld Method
    • Young, R.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.