Confidence intervals for steady state availability of a system with exponential operating time and lognormal repair time

Applied Mathematics and Computation

Volumn 137, Issue 2-3, 2003, Pages 499-509

  Ananda, Malwane M A ^a  

^a UNIVERSITY OF NEVADA   (United States)

Author keywords

Confidence intervals; Lognormal repair times; Steady state availability

Indexed keywords

FAILURE ANALYSIS; PARAMETER ESTIMATION; PROBABILITY DISTRIBUTIONS; REPAIR;

LOGNORMAL DISTRIBUTIONS;

PARALLEL PROCESSING SYSTEMS;

EID: 0037466712     PISSN: 00963003     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0096-3003(02)00155-8     Document Type: Article

References (20)

1. Ananda M.M.A. Bayesian and non-Bayesian solutions to analysis of covariance models under heteroscedasticity. Journal of Econometrics. 86:1998;177-192.
2. Ananda M.M.A. Estimation and testing of availability of a parallel system with exponential failure and repair times. Journal of Statistical Planning and Inference. 77:1999;237-246.
3. Ananda M.M.A., Weerahandi S. Testing the difference of two exponential means using generalized p-values. Communications in Statistics - Simulation and Computation. 25(2):1996;521-532.
4. Ananda M.M.A., Weerahandi S. Two-way ANOVA with unequal cell frequencies and unequal variances. Statistica Sinica. 7:1997;631-646.
5. Chandrasekhar P., Natarajan R., Sujatha H.S. Confidence limits for steady state availability of systems. Microelectronics and Reliability. 34(8):1994;1365-1367.
6. Chandrasekhar P., Natarajan R. Confidence limits for steady state availability of systems with lognormal operating time and inverse gaussian repair time. Microelectronics and Reliability. 37(6):1997;969-971.
7. Chi E.M., Weerahandi S. Comparing treatments under growth curve models with compound-symmetric covariance structure: exact tests using generalized p-values. Journal of Statistical Planning and Inference. 71(1-2):1998;179-189.
8. Gamage J., Weerahandi S. Size performance of some tests in one-way anova. Communications in Statistics - Simulation and Computations. 27(3):1998;625-640.
9. Gray H.L., Lewis T.O. A confidence interval for the availability ratio. Technometrics. 9:1967;465-471.
10. Gray H.L., Schucany W.R. Lower confidence limits for availability assuming lognormally distributed repair times. IEEE Transactions on Reliability. R-18:1969;157-162.
11. Maintainability Design Criteria Handbook for Designers of Shipboard Electronic Equipment, Bureau of Ships, Navships 94324, 1965.
12. Masters B.N., Lewis T.O., Kolarik W.J. A confidence interval for the availability ratio for systems with weibull operating time and lognormal repair time. Microelectronics and Reliability. 32(1/2):1992;89-99.
13. Martz H.F., Waller R.A. Bayesian Reliability Analysis. 1982;John Wiley & Sons, London.
14. Thompson M. Lower confidence limits and a test of hypotheses for system availability. IEEE Transactions on Reliability. R-15:1966;32-36.
15. Tsui K., Weerahandi S. Generalized p-values in significance testing of hypotheses in the presence of nuisance parameters. Journal of the American Statistical Association. 84:1989;602-607.
16. Weerahandi S. Generalized confidence intervals. Journal of the American Statistical Association. 88:1993;899-905.
17. Weerahandi S. Exact Statistical Methods for Data Analysis. 1995;Springer-Verlag, New York.
18. Weerahandi S., Johnson R.A. Testing reliability in a stress-strength model when X and Y are normally distributed. Technometrics. 34:1992;83-91.
19. Koschat M.A., Weerahandi S. Chow-type tests under heteroscedasticity. Journal of Business and Economic Statistics. 10:1992;221-228.
20. Zhou L., Mathew T. Some tests for variance components using generalized p values. Technometrics. 36(4):1994;394-402.