The occurence of shear banding in a millimeter scale (1̄2̄3)[634] grain of an Al-4.5% Mg alloy during plane strain compression

Materials Science and Engineering A

Volumn 347, Issue 1-2, 2003, Pages 32-41

  Chapelle, David ^a   Darrieulat, Michel ^a  

^a CENTRE SMS   (France)

Author keywords

Channel die; Crystalline orientation; Deformation maps; EBSD; Shear bands

Indexed keywords

BACKSCATTERING; COMPACTION; CRYSTALLOGRAPHY; ELECTRONS; SHEAR STRESS;

STRAIN COMPRESSION;

ALUMINUM ALLOYS;

ALUMINUM ALLOY; COMPRESSION; STRAIN;

EID: 0037466682     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(02)00556-7     Document Type: Article

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